幾種常用芯片檢測的設(shè)計與實現(xiàn)

摘 要

芯片作為計算機基本輸入輸出的程序、系統(tǒng)設(shè)置信息、開機上電自檢程序和系統(tǒng)啟動自舉程序的工具，為計算機提供最底層的、最直接的硬件設(shè)置和控制。為確保安全性和穩(wěn)定性，避免不必要的損失，其檢測就顯得尤為重要。本文介紹了常用芯片檢測系統(tǒng)的一種設(shè)計方案，其基本原理是通過數(shù)據(jù)比較來確定芯片的好壞。本系統(tǒng)通過對時間頻率的測量，確定定時計數(shù)器的好與否；通過給標(biāo)準(zhǔn)8255送入數(shù)據(jù)，再將標(biāo)準(zhǔn)8255輸出的數(shù)據(jù)送給待測芯片，經(jīng)數(shù)據(jù)比較判斷常用芯片好壞；通過對8255輸入數(shù)據(jù)，對244和374進行判斷；通過ADC0809來測量標(biāo)準(zhǔn)電壓，并測量0832輸出的標(biāo)準(zhǔn)電壓來檢測AD和DA模塊。操作時，將待測芯片對應(yīng)鍵按下，經(jīng)過系統(tǒng)測試后，以數(shù)碼管來顯示芯片是否能夠正常工作。其優(yōu)點是簡單實用、操作方便、經(jīng)濟效益，可以迅速的檢測出芯片的工作是否正常。文中闡述了設(shè)計思路，同時也給出了相應(yīng)的原理圖和流程圖。

關(guān)鍵詞：檢測;芯片;數(shù)據(jù)比較;測量

Abstract

Chip as a tool of the computer's basic input-output procedures, system setup information, Power on Self Test on the boot process and system bootstrap program to start, to provide the bottom, the most direct control and the hardware settings of the computer. To ensure the security and stability, to avoid unnecessary losses and its detection seem particularly important. In this dissertation, I have introduced a design of common chip detection system and its basic principle is that the quality of chips can be determined through the data comparison. The system define timing counter whether good or not by time-frequency measurements; by sending data to the normal 8255, then transferring the output datum to the chip needing check, judge common chip whether good or not by data comparison; judge 244 and 374 according to input the data to 8255; measure the standard voltage that come through ADC0809, and detect the AD and DA modules by measuring the standard of 0832 output voltage. While operating, press the corresponding button of the chip which waiting for measurement, after the system measurement, Chip can work properly or not will be showed by Digital tube. The advantage is simple and practical, easy to operate, cost-effective, can be quickly detected the normal work of the chip. The paper described the design ideas, as well as the corresponding schematic diagram and flow chart.

Keywords: detection; chip; data comparison; measurement

目 錄

0  前言……………………………………………………………………………1
1  AT89C51單片機的功能簡要介紹…………………………………………2
1.1AT89C51簡介…………………………………………………………………2
1.2  AT89C51的的引腳功能…………………………………………………2
1.3  AT89C51的定時/計數(shù)器…………………………………………………3
1.4 串行通信……………………………………………………………………5
2  74LS138譯碼器的簡要介……………………………………………………7
2.1  74LS138工作原理………………………………………………………7
2.2  74LS138引腳功能……………………………………………………7
2.3  74LS138譯碼器真值表…………………………………………………7
3  地址鎖存器74LS373的簡要介紹…………………………………9
3.1  74LS373工作原理………………………………………………………9
3.2  74LS373引腳說明……………………………………………………9
3.3  74LS373內(nèi)部結(jié)構(gòu)……………………………………………………9
3.4  74LS373的優(yōu)點……………………………………………………10
4  芯片8255的檢測…………………………………………………………11
4.1  內(nèi)部結(jié)構(gòu)和引腳功能…………………………………………………11
4.2  8255控制字和狀態(tài)字……………………………………………………13
4.3  芯片8255的檢測方法…………………………………………………14
4.4  芯片8255的電路原理圖………………………………………………14
4.5  芯片8255的測程序流程圖……………………………………………15
4.6  芯片8255的檢測程序…………………………………………………16
5  芯片74ls244的檢測…………………………………………………17
5.1  74LS244特性………………………………………………………17
5.2  74LS244的檢測方法……………………………………………17
5.3  74LS244的檢測電路圖………………………………………………17
5.4  74LS244的檢測程序流程圖………………………………18
5.5  74LS244的檢測程序………………………………………………18
6  芯片74LS374的檢測的檢測……………………………………………20
6.1  74LS374的特性……………………………………………………20
6.2  74LS374的檢測方法………………………………………………20
6.3  74LS374的檢測電路圖…………………………………………20
6.4  74LS374的檢測流程圖…………………………………………………21
6.5  74LS374的檢測程序……………………………………………22
7  芯片ADC0809的檢測…………………………………………………24
7.1  ADC0809內(nèi)部結(jié)構(gòu)……………………………………………………24
7.2  0809的檢測方法………………………………………………………25
7.3  0809的檢測電路圖………………………………………………………25
7.4  0809的檢測程序流程圖…………………………………………………26
7.5  0809的檢測程序……………………………………………………26
8  芯片0832的檢測……………………………………………………29
8.1  0832的內(nèi)部特性……………………………………………………29
8.2  0832的檢測方法……………………………………………………30
8.3  0832的檢測電路原理圖…………………………………………………31
8.4  0832的檢測流程圖……………………………………………………31
8.5  0832的檢測程序……………………………………………………32
9  芯片8253的檢測……………………………………………………35
9.1  8253基本結(jié)構(gòu)和功能……………………………………………………35
9.2  8253的編程說明……………………………………………………36
9.3  8253的檢測方法……………………………………………………38
9.4  8253的檢測電路原理圖…………………………………………………38
9.5  8253的檢測程序流程圖…………………………………………………39
9.6  8253的檢測程序…………………………………………………39
10  技術(shù)經(jīng)濟分析………………………………………………………………42
11  結(jié)論…………………………………………………………………………43
致謝…………………………………………………………………………44
參考文獻…………………………………………………………………………45
附錄A譯文…………………………………………………………46
附錄B 外文文獻……………………………………………………………57